A device has been developed for studying strain sensitivity in photosensitive wide-gap semiconductor thin films. The device allows the study of strain sensitivity in photosensitive wide-gap semiconductor thin films when illuminated with natural and monochromatic light within the deformation range from -2•10-3 to 2•10-3 rel. At the same time, this device makes it possible to deform the same film repeatedly without destroying it.
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S., Daliev Kh.; K., Onarkulov M.; and M., Otajonov S.
"DEVICE FOR STUDYING TENZE SENSITIVITY IN PHOTOSENSITIVE SEMICONDUCTOR FILMS,"
Euroasian Journal of Semiconductors Science and Engineering: Vol. 3:
1, Article 5.
Available at: https://uzjournals.edu.uz/semiconductors/vol3/iss1/5