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Euroasian Journal of Semiconductors Science and Engineering

Euroasian Journal of Semiconductors Science and Engineering

Abstract

A device has been developed for studying strain sensitivity in photosensitive wide-gap semiconductor thin films. The device allows the study of strain sensitivity in photosensitive wide-gap semiconductor thin films when illuminated with natural and monochromatic light within the deformation range from -2•10-3 to 2•10-3 rel. At the same time, this device makes it possible to deform the same film repeatedly without destroying it.

References

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