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Euroasian Journal of Semiconductors Science and Engineering

Euroasian Journal of Semiconductors Science and Engineering

Abstract

The morphological features and exact dimensional characteristics of fullerene-containing nanoaggregates and thin films by electron and atomic force microscopy are established. In the process of cooling the C70 solution from ~30°C to ~20°C, fractal spherical C70 nanoaggregates with diameters of ~150÷200 nm are formed on the surface of the cover glass in the solution.It was found that a fullerene-containing film obtained in the process of solvent evaporation from the volume of a drop of C70 solution on a horizontally located substrate (heated to ~33°C) is completely crystalline and nanostructured.

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