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Euroasian Journal of Semiconductors Science and Engineering

Euroasian Journal of Semiconductors Science and Engineering

Issue 5

Articles

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SEMICONDUCTOR WAFERS TESTING BASED ON ELECTRON WORK FUNCTION OF SURFACE
K. Panteleev, A. Zharin, V. Mikitsevich, and O. Gusev

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INFLUENCE OF THE CLUSTERS OF IMPURIENT NICKEL ATOMS ON THE CRYSTALLINE SILICON STRUCTURE
N. Turgunov, S. Zainabidinov, Sh. Akbarov, and E. Berkinov

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TEMPERATURE SENSITIVITY OF DIODE TEMPERATURE SENSOR WITH DEPLETED BASE REGION
R. Bebitov, O. Abdulkhaev, T. Juraboyev, and A. Rakhmatov

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STUDYING THE PROPERTIES OF GADOLINIUM-DOPED SILICON
Sh. Norkulov, Kh. Daliev, Z. Khusanov, and Kh. Utemuratova

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METHOD FOR DETERMINING THE CONTACT RESISTANCE OF THERMOELEMENTS
T. Azimov, K. Gajnazarova, and K. Onarkulov

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OPTIMIZATION OF OPERATING MODES OF THE HOUSEHOLD PHOTOVOLTAIC SYSTEM
E. Saitov, J. Toshov, Sh. Umarov, and B. Nasriddinov