Euroasian Journal of Semiconductors Science and Engineering
Article Title
TECHNOLOGICAL FEATURES OF OBTAINING STRENGTH SENSITIVE POLYCRYSTALLINE FILMS Bi2-XSbXTe3
Abstract
The results of studying the effect of substrate temperature and evaporation rate on the kinetic coefficients and strain sensitivity of Bi2-xSbxTe3 films obtained by thermal evaporation in vacuum are presented.
Recommended Citation
Onarkulov, M.; Nasriddinov, S.; Yuldashev, Sh.; and Yunusaliev, L.
(2020)
"TECHNOLOGICAL FEATURES OF OBTAINING STRENGTH SENSITIVE POLYCRYSTALLINE FILMS Bi2-XSbXTe3,"
Euroasian Journal of Semiconductors Science and Engineering: Vol. 2
:
Iss.
3
, Article 10.
Available at:
https://uzjournals.edu.uz/semiconductors/vol2/iss3/10
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