Euroasian Journal of Semiconductors Science and Engineering
Issue 3
Articles
DIFFUSION OF CLUSTERS OF IMPURITY NICKEL ATOMS IN A SILICON LATTICE
M. Bakhadirkhanov, B. Ismaylov, and S. Tachilin
DEFECT FORMATION DURING LOW-TEMPERATURE ANNEALING OF
SILICON DOPED WITH ION IMPURITIES
Sh. Utamuradova, A. Uteniyazova, K. Fayzullaev, and E. Naurzalieva
TEMPERATURE - WAVE EFFECTS OCCURRING IN SEMICONDUCTORS WITH DEEP IMPURITY CENTERS UNDER PULSED HYDROSTATIC COMPRESSION
R. Khamidov and O. Mamatkarimov
FERMI THEORY ON DIMENSION EFFECTS IN MULTIPLE EXCITON GENERATION
M. Marasulov, N. Turaeva, and B. Oksengendler
FEATURES OF SILICON p-n STRUCTURES WITH A LARGE SENSITIVE SURFACE AND A VOLUME CHARGE AREA
R. Muminov, G. Ergashev, B. Radjapov, and E. Rumyantseva
DEFECT STRUCTURE OF SILICON WITH AN IMPURITY OF TUNGSTEN UNDER THE INFLUENCE OF EXTERNAL FACTORS
Sh. Daliev, A. Paluanova, J. Ergashev, and A. Rakhimov
TECHNOLOGICAL FEATURES OF OBTAINING STRENGTH SENSITIVE POLYCRYSTALLINE FILMS Bi2-XSbXTe3
M. Onarkulov, S. Nasriddinov, Sh. Yuldashev, and L. Yunusaliev
ABOUT THE CHARACTERISTICS OF MULTILAYER THIN-FILM STRUCTURES WITH DYES BASED ON TITANIUM DIOXIDE
O. Mamatkarimov, A. Abdukarimov, and Oktamaliev
INFLUENCE OF THE GAMMA IRRADIATION ONTO IV CURVE OF THE SURFACE BARRIER METALL-SEMICONDUCTOR STRUCTURES WITH MICRO-TEXTURED INTERFACE
M. Tagaev, V. Statov, and S. Bekbergenov
STUDY OF STRUCTURAL DISORDERING OF SILICON IONIC IMPLANTED WITH MANGANESE BY THE METHOD OF COMBINATION LIGHT SCATTERING (RS).
E. Arzikulov, F. Salakhitdinov, and M. Tashboev
THE EFFICIENCY OF SOLAR DRYERS
K. Abduraxmanov and U. Tahirov
INVESTIGATION OF DEGREDATION OF ORGANIC SOLAR CELLS
E. Zakhidov, I. Tajibaev, M. Imomov, and V. Quvondikov
MACHINE LEARNING BASED ALGORITHMS FOR WIND TURBINES WITH DFIG CONTROL
D. Ilyin, T. Shestopalova, and A. Vaskov
MULTICHANNEL OPTICAL SPECTRUM RECORDER FOR MICROELEMENTS DETERMINATION
N. Jeenbaev, A. Chylymov, R. Tashtanov, and G. Dorjueva
HUMIDITY SENSORS BASED ON COMPOSITE MATERIAL WITH NANO-DIMENSIONAL STRUCTURES
B. Egamberdiev, F. Isroilov, and C. Rahmatullaev
THE INFLUENCE OF EXTERNAL FACTORS ON PROPERTIES OF IRRADIATED SILICON MIS STRUCTURES
Z. Khusanov, Kh. Daliev, Allayarov, and U. Erugliyev