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Euroasian Journal of Semiconductors Science and Engineering

Article Title

ANALYSIS OF THE DISTRIBUTION OF ERRORS BASED ON PROBABILISTIC CHARACTERISTICS OF THE PROBE SOLID STATE TEMPERATURE TRANSDUCERS

Abstract

An analysis of the errors of probe temperature transducers based on probable characteristics is given. It is shown that the probability of occurrence of fluctuation processes during the operation of the investigated probe semiconductor temperature transducers is minimized due to the uniformity of design features.

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