Scientific Bulletin of Namangan State University
Article Title
THE THERMAL FIELD MIGRATION AND ELECTRODIFFUSION OF CHARGED POINT DEFECTS IN POLYCRYSTALLINE FILMS
Abstract
Correlation between spectrum of the low temperature (T 4.2 K) photoluminescence and anomalous photovoltages properties of slanting evaporating polikryistallin thin films CdTe, CdTe : In is discovered. In spectrum undoped sample on a number double-acting by band dominated the band to own luminescence, conditioned presence potential barrier on border of grains. Alloyage an impurity In brings about stewing doubleacting bands, but the most further thermal processing - to cutting the activations of the own band, full width on half maximum which is bound by maximum value photo generated voltage V V sm АPV 10 / 3
First Page
40
Last Page
47
References
1.Matveev O.A., Terentev A.I. Osnovne princhip poslerostovogo otjiga slitka CdTe :Cl dlya polusheniya poluizoliruyushix kristallov // Fizika i texnika poluprovodnikov. T.34. №11-S. 1316-1321. (2005). 2. Ismailov X.X., Janabergenov J., Mirsagatov Sh.A., Karajanov S.J. Dinamika perezaryadki defektov v krupnobloshnx plenkax p CdTe // Fizika i texnika poluprovodnikov.T.40. №2.-S. 185-187. (2006) 3. Karimov M.A., Yuldashev N.X. Rol termopolevoy migrachii ionov In+ i vakansiy kadmiya j Cd V v fotovoltaisheskix svoystvax polikristallisheskix plenok CdTe:In:C // Uzbekskiy fizisheskiy jurnal. T.8. №6.-S. 306-316.(2006) 4. Veleshuk V.P., Baydullaeva A., Vlasenko A.I., Gnatyuk V.A. i dr. Massoperenos indiya v strukture pri nanosekundnom lazernom oblushenii // Fizika tverdogo tela. T.3. №52. -S. 439-445. (2010) 5.Bagaev V.S., Onishenko Ye.Ye. Osobennosti temperaturnoy zavisimosti fotolyumineschenchii sverxreshetok kvantovx toshek CdTe / ZnTe //Fizika tverdogo tela.T.47.№1.-S.168- 171 (2005) 6.Axmadaliev B.J., Kari
Erratum
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Recommended Citation
Polvonov, Bakhtiyor Zaylobidinovich; Nasirov, Mardonbek Haldarbekovich; Akhmadjonov, Mehriddin Fakhridinovich; and Abdulazizov, Bakhrom Toshmirza o’g’li
(2021)
"THE THERMAL FIELD MIGRATION AND ELECTRODIFFUSION OF CHARGED
POINT DEFECTS IN POLYCRYSTALLINE FILMS,"
Scientific Bulletin of Namangan State University: Vol. 2
:
Iss.
2
, Article 7.
Available at:
https://uzjournals.edu.uz/namdu/vol2/iss2/7