Scientific Bulletin of Namangan State University


In this manuscript, films of amorphous hydrogenated silicon were studied by using the photo-VACH characteristics of the vidicon target. In the photo-VACH characteristic, a region is observed that obeys the quadratic law. It is explained that the contribution of changes in the dielectric constant of a-Si:H and the hole lifetime depending on the applied voltage for obtaining information from this section about the hole transportation mechanism is too significant.

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