Scientific-technical journal
Abstract
This paper describes the use of an additional inspection drift to improve the electro physical dimensions of a large-sized Si (Li) p-i-n structure.
First Page
18
Last Page
21
References
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Recommended Citation
Muminov, R. A.; Ergashev, G. J.; Saymbetov, A. K.; Toshmurodov, Yo K.; and Yavqochdiyev, M. O.
(2020)
"APPLICATION OF ADDITIONAL LEVELING DRIFT PROCESS TO IMPROVE THE ELECTROPHYSICAL PARAMETERS OF LARGE SIZED Si (Li) p-i-n STRUCTURES,"
Scientific-technical journal: Vol. 24
:
Iss.
5
, Article 4.
Available at:
https://uzjournals.edu.uz/ferpi/vol24/iss5/4