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Scientific-technical journal

Abstract

The microstructure of thin (Bi,Sb)2Te3 films prepared by thermal evaporation of stoichiometric (Bi,Sb)2Te3 crystals in vacuum different substrates were studied using X-ray diffraction, scanning electron microscopy. The obtained thin films were polycrystalline, exhibited p-type conductivity and do contain phases for (Bi,Sb)2Te3 . The results obtained show that using a simple and inexpensive method of thermal evaporation from a single source and choosing optimal technological parameters, one can grow thin p- (Bi,Sb)2Te3 films of sufficiently high quality.

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