The microstructure of thin (Bi,Sb)2Te3 films prepared by thermal evaporation of stoichiometric (Bi,Sb)2Te3 crystals in vacuum different substrates were studied using X-ray diffraction, scanning electron microscopy. The obtained thin films were polycrystalline, exhibited p-type conductivity and do contain phases for (Bi,Sb)2Te3 . The results obtained show that using a simple and inexpensive method of thermal evaporation from a single source and choosing optimal technological parameters, one can grow thin p- (Bi,Sb)2Te3 films of sufficiently high quality.
"INFLUENCE OF THE STRUCTURE OF TENSOR-RESISTIVE FILMS (Bi,Sb)2Te3 ON THE PHYSICAL MECHANISMS OF TRANSFER MEDIA CHARGE,"
Scientific-technical journal: Vol. 22
, Article 22.
Available at: https://uzjournals.edu.uz/ferpi/vol22/iss3/22