Scientific-technical journal


The microstructure of thin films prepared by thermal evaporation of stoichiometric crystals in vacuum different substrates were studied using X-ray diffraction, scanning electron microscopy. The obtained thin films were polycrystalline, exhibited p-type conductivity and do contain phases for . The results obtained show that using a simple and inexpensive method of thermal evaporation from a single source and choosing optimal technological parameters, one can grow thin p- films of sufficiently high quality.

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